Black-Box Firmware Compliance Testing of Programmable IC Chips Using Power Side-Channels

dc.contributor.authorPatel, Jenish
dc.date.accessioned2026-09-21T19:51:01Z
dc.date.issued2026-09-21
dc.date.submitted2026-09-17
dc.description.abstractModern safety-critical embedded systems depend heavily on Commercial Off-The-Shelf (COTS) programmable Integrated Circuits (ICs) sourced through complex global supply chains. Sourcing these ICs introduces a major vulnerability, as actors in the supply chain can maliciously tamper with or inadvertently modify the IC firmware prior to integration. These unauthorized modifications directly compromise firmware integrity, making it difficult for system integrators to verify that the IC runs qualified code without access to the source code or binary images. To address this challenge, we propose a firmware compliance method based on physical side-channel behavior. This method compares dynamic power consumption traces from an untrusted IC with a trusted golden reference that executes identical inputs to detect firmware non-compliance. Detecting non-compliant ICs requires a comparison method that is invariant to physical noise and sensitive to genuine firmware differences. Distortions vary across hardware and are challenging to predict before testing. Relying on a single fixed comparison method risks overlooking firmware changes, thereby reducing the efficacy of detecting non-compliance ICs. To address the challenge of selecting an effective comparison method under varying distortion levels, this thesis presents an evaluation framework that assesses a set of comparison methods for firmware compliance. Rather than prescribing a single method, the framework evaluates a suite of methods and produces performance metrics that determine which methods work well for a given target IC. Applying this framework across three commercial ICs shows that power-based side-channels can effectively detect non-compliant firmware and provides metrics to select the appropriate comparison method.
dc.identifier.urihttps://hdl.handle.net/10012/24355
dc.language.isoen
dc.pendingfalse
dc.publisherUniversity of Waterlooen
dc.titleBlack-Box Firmware Compliance Testing of Programmable IC Chips Using Power Side-Channels
dc.typeMaster Thesis
uws-etd.degreeMaster of Science
uws-etd.degree.departmentElectrical and Computer Engineering
uws-etd.degree.disciplineElectrical and Computer Engineering
uws-etd.degree.grantorUniversity of Waterlooen
uws-etd.embargo.terms2 years
uws.contributor.advisorFischmeister, Sebastian
uws.contributor.affiliation1Faculty of Engineering
uws.peerReviewStatusUnrevieweden
uws.published.cityWaterlooen
uws.published.countryCanadaen
uws.published.provinceOntarioen
uws.scholarLevelGraduateen
uws.typeOfResourceTexten

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